Fast Monte Carlo method via reduced sample number and node filtering

Inhak Han, Lee-eun Yu, Youngsoo Shin
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Abstract

Monte Carlo (MC) method is convenient and robust to estimate timing yield of circuits under the influence of process variations. The important question in MC method is the number of samples while we assure a desired accuracy of yield estimate, which is often addressed using a rule of thumb. Minimum number of samples can be estimated via approximation by a normal distribution, but the provided number may be too small to be used in practice considering that target yield, which is used to derive the number, is unknown. Chebyshev's inequality has been used to derive a sample number, but the number is too large this time. We develop a new expression, which provides the sample number that is much closer to the minimum (3× to 8×) compared to the number provided by Chebyshev's inequality (5× to 15×). We also propose a simple node filtering algorithm, where we identify the nodes that are likely to affect timing yield; the simulation with each MC sample can handle only a fraction of circuit elements as a result. Reducing the number of MC samples and simulating only selected nodes together yield 27× to 125× speedup over standard MC method.
快速蒙特卡罗方法通过减少样本数量和节点滤波
蒙特卡罗(MC)方法对于过程变化影响下的电路时序良率估计具有方便和鲁棒性。在MC方法中,重要的问题是样品的数量,同时我们保证期望的产量估计的准确性,这通常是使用经验法则来解决的。最小样本数量可以通过正态分布的近似估计,但考虑到用于推导样本数量的目标产量未知,所提供的样本数量可能太小而无法在实践中使用。切比雪夫不等式已经被用来推导一个样本数,但是这次的样本数太大了。我们开发了一个新的表达式,它提供了更接近最小值(3x到8x)的样本数,而不是由切比雪夫不等式(5x到15x)提供的样本数。我们还提出了一种简单的节点过滤算法,其中我们识别可能影响时序产量的节点;因此,每个MC样本的模拟只能处理一小部分电路元件。减少MC样本数量并只模拟选定的节点,与标准MC方法相比,速度提高了27到125倍。
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