Olli-Pekka Kilpi, Jun Wu, J. Svensson, E. Lind, L. Wernersson
{"title":"Vertical heterojunction InAs/InGaAs nanowire MOSFETs on Si with Ion = 330 μA/μm at Ioff = 100 nA/μm and VD = 0.5 V","authors":"Olli-Pekka Kilpi, Jun Wu, J. Svensson, E. Lind, L. Wernersson","doi":"10.23919/VLSIT.2017.7998191","DOIUrl":null,"url":null,"abstract":"We present vertical InAs nanowire MOSFETs on Si with an In<inf>0.7</inf>Ga<inf>0.3</inf>As drain. The devices show Ion and gm/SS record performance for vertical MOSFETs and I<inf>off</inf> below 1 nA/μm at V<inf>d</inf> 0.5 V. We show a device with gm=1.4 mS/μm and SS=85 mV/dec, therefore having Q-value (gm/SS) of 16. The device has I<inf>on</inf>=330 μA/μm and 46 μA/μm at Ioff 100 nA/μm and 1 nA/μm, respectively. Furthermore, we show a device with SS=68 mV/dec and I<inf>on</inf>=88 μA/μm at I<inf>off</inf> 1 nA/μm and V<inf>d</inf> 0.5 V.","PeriodicalId":333275,"journal":{"name":"2017 Symposium on VLSI Technology","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 Symposium on VLSI Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/VLSIT.2017.7998191","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
We present vertical InAs nanowire MOSFETs on Si with an In0.7Ga0.3As drain. The devices show Ion and gm/SS record performance for vertical MOSFETs and Ioff below 1 nA/μm at Vd 0.5 V. We show a device with gm=1.4 mS/μm and SS=85 mV/dec, therefore having Q-value (gm/SS) of 16. The device has Ion=330 μA/μm and 46 μA/μm at Ioff 100 nA/μm and 1 nA/μm, respectively. Furthermore, we show a device with SS=68 mV/dec and Ion=88 μA/μm at Ioff 1 nA/μm and Vd 0.5 V.