R. Dinwiddie, M. Kirka, P. D. Lloyd, R. Dehoff, L. E. Lowe, G. S. Marlow
{"title":"Calibrating IR cameras for in-situ temperature measurement during the electron beam melt processing of Inconel 718 and Ti-Al6-V4","authors":"R. Dinwiddie, M. Kirka, P. D. Lloyd, R. Dehoff, L. E. Lowe, G. S. Marlow","doi":"10.1117/12.2229070","DOIUrl":null,"url":null,"abstract":"High performance mid-wave infrared (IR) cameras are used for in-situ electron beam melt process monitoring and temperature measurements. Since standard factory calibrations are insufficient due to very low transmissions of the leaded glass window required for X-ray absorption, two techniques for temperature calibrations are compared. In-situ measurement of emittance will also be discussed. Ultimately, these imaging systems have the potential for routine use for online quality assurance and feedback control.","PeriodicalId":299313,"journal":{"name":"SPIE Commercial + Scientific Sensing and Imaging","volume":"119 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"22","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SPIE Commercial + Scientific Sensing and Imaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2229070","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 22
Abstract
High performance mid-wave infrared (IR) cameras are used for in-situ electron beam melt process monitoring and temperature measurements. Since standard factory calibrations are insufficient due to very low transmissions of the leaded glass window required for X-ray absorption, two techniques for temperature calibrations are compared. In-situ measurement of emittance will also be discussed. Ultimately, these imaging systems have the potential for routine use for online quality assurance and feedback control.