Fermi level pinning alleviation at the TiN, ZrN, and HfN/Ge interfaces

K. Yamamoto, Dong Wang, H. Nakashima
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Abstract

ZrN and HfN/Ge contacts showed FLP alleviation similar to TiN/Ge. Especially, ZrN indicated stronger alleviation than TiN. About all materials, the ΦBPs estimated using J-V and C-V methods are almost the same. It is supposed that the interfacial structures of metal nitride/Ge are uniform.
TiN、ZrN和HfN/Ge界面的费米能级钉钉缓解
ZrN和HfN/Ge接触的FLP缓解与TiN/Ge相似。其中ZrN的缓解作用强于TiN。对于所有材料,用J-V法和C-V法估算的ΦBPs几乎相同。推测金属氮化物/锗的界面结构是均匀的。
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