K. Spears, A.V. Pohm, J. Daughton, R. Sinclair, J. Brown
{"title":"The Architecture Of Wafer Scale Memories With Giant Magneto-resistance Memory Cells","authors":"K. Spears, A.V. Pohm, J. Daughton, R. Sinclair, J. Brown","doi":"10.1109/NVMT.1993.696963","DOIUrl":null,"url":null,"abstract":"For practical wafer scale memories to be achieved, the memory cells in the structure must have a number of properties. First the memory cells must be non-volatile so that unloading on shut down and loading on start up are not necessary. Secondly, it should be possible to power up the cells in a short time and shut them off quickly so that only a small fraction of the wafer is powered at one time. The cells should have infinite write and read capability with cycle times of at most a few microseconds. It must be possible to make small sub-sections of the wafer with high yield with provisions to discard malfunctioning sub-sections. Simple bus structures must be possible to supply power and carry addresses and signals. The cells should be simple to make with few masking steps and have a high density set by minimum metal pitch for two layers of metal (1). To provide economical packaging, the memory cells should integrate with the semiconductor drive electronics.","PeriodicalId":254731,"journal":{"name":"[1993 Proceedings] Fifth Biennial Nonvolatile Memory Technology Review","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1993 Proceedings] Fifth Biennial Nonvolatile Memory Technology Review","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NVMT.1993.696963","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
For practical wafer scale memories to be achieved, the memory cells in the structure must have a number of properties. First the memory cells must be non-volatile so that unloading on shut down and loading on start up are not necessary. Secondly, it should be possible to power up the cells in a short time and shut them off quickly so that only a small fraction of the wafer is powered at one time. The cells should have infinite write and read capability with cycle times of at most a few microseconds. It must be possible to make small sub-sections of the wafer with high yield with provisions to discard malfunctioning sub-sections. Simple bus structures must be possible to supply power and carry addresses and signals. The cells should be simple to make with few masking steps and have a high density set by minimum metal pitch for two layers of metal (1). To provide economical packaging, the memory cells should integrate with the semiconductor drive electronics.