{"title":"Break fault model and fault collapsing analysis for PLA's","authors":"Gwo-Haur Hwang, W. Shen","doi":"10.1109/ATS.1992.224412","DOIUrl":null,"url":null,"abstract":"The behavior of break faults in PLAs is analyzed and a fault collapsing technique for the faults is presented. From the behavioral analysis, two patterns are needed to detect a break fault. By the fault collapsing technique, the number of break faults is reduced from 2*( Hash device)+( Hash output) to less than 2*( Hash input+ Hash product)+( Hash output). Experimental results show that, for 56 benchmarks, the number of break faults after fault collapsing is reduced to 18.37%.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"105 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224412","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
The behavior of break faults in PLAs is analyzed and a fault collapsing technique for the faults is presented. From the behavioral analysis, two patterns are needed to detect a break fault. By the fault collapsing technique, the number of break faults is reduced from 2*( Hash device)+( Hash output) to less than 2*( Hash input+ Hash product)+( Hash output). Experimental results show that, for 56 benchmarks, the number of break faults after fault collapsing is reduced to 18.37%.<>