Microsensors for Partial Discharge

H. Tomas, P. Michal
{"title":"Microsensors for Partial Discharge","authors":"H. Tomas, P. Michal","doi":"10.1109/ENICS.2008.17","DOIUrl":null,"url":null,"abstract":"For longer service life and better reliability of high voltage under stressed parts or of such whole systems, facilities for deep investigation are necessary. Extremely small microsensors which can be integrated during the production inside measured object like high voltage transformers, drivers or high voltage parts of PCB's are, can serve us valued information about discharge activity during whole service life.","PeriodicalId":162793,"journal":{"name":"2008 International Conference on Advances in Electronics and Micro-electronics","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Conference on Advances in Electronics and Micro-electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ENICS.2008.17","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

For longer service life and better reliability of high voltage under stressed parts or of such whole systems, facilities for deep investigation are necessary. Extremely small microsensors which can be integrated during the production inside measured object like high voltage transformers, drivers or high voltage parts of PCB's are, can serve us valued information about discharge activity during whole service life.
局部放电用微传感器
为了延长高压受压部分或整个系统的使用寿命和提高可靠性,需要有深入研究的设施。极小的微传感器可以在生产过程中集成在被测量对象内,如高压变压器,驱动器或PCB的高压部件,可以在整个使用寿命期间为我们提供有关放电活动的宝贵信息。
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