Simplified analytical model of resonant-tunneling diode

V. Moskalyuk, A. Fediai
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引用次数: 1

Abstract

Simplified analytical model for analysis of influence of the main parameters of resonant-tunneling diode's (RTD) topology on its static electric characteristics was developed. Analytical relations that relate electric characteristics of RTD with the main design parameters: widths of layers' in active region, chemical compound of layers, doping level of reservoirs, lattice temperature were obtained. The results of modeling were tested for model structures of RTDs with barrier layers formed of AlxGa1−xAs and AlxGa1−xN. The model is free of numerical instabilities and adequately expresses the main tendencies in the dependencies of I–V characteristics' parameters on the topology. It has been formulated such, that the computational resources are used efficiently and allow to trace the impact of all listed parameters on the energy structure of active region, and how those changes affect on the shape of I–V characteristics step-by-step.
谐振隧道二极管的简化解析模型
建立了谐振隧道二极管(RTD)拓扑结构主要参数对其静电特性影响的简化分析模型。得到了RTD电特性与主要设计参数:活性区层宽、层化合物、储层掺杂水平、晶格温度之间的解析关系。用AlxGa1−xAs和AlxGa1−xN形成阻挡层的rtd模型结构对建模结果进行了检验。该模型没有数值不稳定性,并充分表达了I-V特征参数对拓扑的依赖关系的主要趋势。它的制定是这样的,计算资源得到有效利用,并允许跟踪所有列出的参数对活动区域的能量结构的影响,以及这些变化如何影响I-V特征的形状。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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