Decoupling capacitor derating study under DC bias and cooling environment

Abstract

Passive electronics devices, especial capacitor's capacitance will be changed under different working voltage and thermal condition, which is called derating or degrading. Comparing traditional DoE (Design on Experimental) method to study derating problem, using electrical thermal multiphysics simulation, is more accurate and efficient. In this paper, a simple printed PCB with decoupling capacitors will be simulated under several scenarios: DoE, normal condition(non-derating), derated by working voltage, and derated by working voltage and temperature condition. By comparing the power impedance and noise value under those scenarios, advantages of multiphysics simulation for capacitor's derating will be proved.