Heterogenous integration of III-V MMIC and Si CMOS

LiShu Wu, Y. Kong, Wei Cheng, Youtao Zhang, Tangsheng Chen
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引用次数: 1

Abstract

In this work, we demonstrate the wafer-scale heterogeneous integration of III-V MMIC and Silicon complementary metal oxide semiconductor (Si CMOS) on the same Silicon substrate based on epitaxial layer transfer technique, III-V Compound semiconductor devices are vertical stacked at the top of the Si CMOS wafer using wafer bonding technique. Meanwhile, we exhibit a wide band GaAs digital controlled switch circuit and InP HBT quantizing chip with 1:16 demultiplexer as examples, which shows the potential to integrate III-V MMIC and Si CMOS on the same chip to take advance of the two different material systems.
III-V MMIC与Si CMOS的异质集成
在这项工作中,我们展示了基于外延层转移技术的III-V型MMIC和硅互补金属氧化物半导体(Si CMOS)在同一硅衬底上的晶圆级异质集成,III-V型化合物半导体器件使用晶圆键合技术垂直堆叠在Si CMOS晶圆的顶部。同时,我们展示了宽带GaAs数字控制开关电路和以1:16解复用器为例的InP HBT量化芯片,显示了将III-V MMIC和Si CMOS集成在同一芯片上以推进两种不同材料体系的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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