Stress-strain simulation of solder joints in a BGA package

Cheng Yan, Y. Mai, L. Ye
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Abstract

A nonlinear finite element analysis was carried out to investigate the viscoplastic deformation of solder joints in a ball grid array (BGA) package under temperature cycling. The effects of constraint on print circuit board (PCB) and stiffness of substrate on the deformation behaviour of the solder joints were also studied The results indicated that high inelastic strain was developed in the joints close to the package center. On the other hand, high constraint was associated with the joint closest to the edge of the silicon chip. Increasing external constraint on the PCB caused a slight increase in stress triaxiality in the joint closest to the edge of silicon chip. There was an increase of inelastic strain in the solder joints with increasing the Young's modulus of the substrate.
BGA封装中焊点的应力应变模拟
采用非线性有限元方法研究了温度循环作用下球栅阵列(BGA)封装焊点的粘塑性变形。研究了印刷电路板约束和衬底刚度对焊点变形行为的影响。结果表明,靠近封装中心的焊点产生了高的非弹性应变。另一方面,高约束与最靠近硅片边缘的接头有关。增加PCB上的外部约束导致最靠近硅芯片边缘的接头的应力三轴性略有增加。随着基体杨氏模量的增大,焊点的非弹性应变增大。
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