Evolution of plasma density generated by high power microwaves

S. Beeson, A. Neuber
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Abstract

The relaxation time of pulsed rf-generated plasma is investigated. A 3 MW, 3 μs width, 50 ns risetime HPM pulse is transmitted through a dielectric window that terminates a WR-284 waveguide filled with insulating gas. The investigated plasma is formed across the dielectric window on the atmospheric side. This produces electron densities on the order of 1013 to 1012 cm-3 for 60 to 145 torr in air, respectively. In the same pressure range, initial attenuation (~ 0.5 dB) of the microwaves is observed after tens to hundreds of nanoseconds with final attenuation values approaching -40 to -10 dB, respectively. To determine plasma relaxation times after the HPM pulse terminates a multi-standard waveguide coupler (X/S-band) was designed to inject a low power 10 GHz signal used for probing the surface plasma. The coupler was designed to have high coupling coefficients (> -5 dB) for the specific narrowband around 10 GHz (BW ~ 10 MHz) along with negligible insertion loss of the HPM propagation. From the measured attenuation and reflection of the 10 GHz probe signal, the evolution of the electron density is inferred. Furthermore, in an air environment, the density falls exponentially implying attachment as the dominate electron loss mechanism.
高功率微波产生等离子体密度的演化
研究了脉冲射频等离子体的弛豫时间。一个3 MW、3 μs宽、50 ns上升时的HPM脉冲通过一个介质窗口传输,该窗口终止了一个充满绝缘气体的WR-284波导。所研究的等离子体是在大气侧穿过介电窗形成的。这在空气中产生的电子密度分别为1013到1012 cm-3,温度为60到145 torr。在相同的压力范围内,微波在数十~数百纳秒后出现初始衰减(~ 0.5 dB),最终衰减值分别接近-40 ~ -10 dB。为了确定HPM脉冲终止后等离子体的弛豫时间,设计了一个多标准波导耦合器(X/ s波段)注入低功率10ghz信号,用于探测表面等离子体。该耦合器在10 GHz (BW ~ 10 MHz)左右的特定窄带具有高耦合系数(> -5 dB),并且HPM传播的插入损耗可以忽略不计。从测量到的10ghz探测信号的衰减和反射,推断出电子密度的演变。此外,在空气环境中,密度呈指数下降,这意味着附着是主要的电子损失机制。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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