GaN device-circuit interaction on RF linear power amplifier designed using the MVSG compact model

Pilsoon Choi, U. Radhakrishna, D. Antoniadis, E. Fitzgerald
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引用次数: 2

Abstract

This work presents a GaN RF power amplifier with a common-source-common-gate (CS-CG) linearization technique, demonstrating device-circuit interactions using the physics-based MIT Virtual Source GaNFET (MVSG) model. A few device parameters are carefully chosen to investigate their effects on the circuit performance, as well as to suggest how to fabricate or choose a better GaN device for RF power amplifier design. The designed amplifier achieves 11dB gain at 6GHz, 51% drain efficiency at 35.3dBm Psat, and 39dBm output IP3 with 10V supply voltage. In this work, it is shown that the physical device parameters related to DC, RF, and thermal conditions affect the above circuit performance, especially linearity, and could be used to link the circuit performance to specific device level physics.
采用MVSG紧凑模型设计射频线性功率放大器的GaN器件-电路相互作用
本研究提出了一种具有共源-共门(CS-CG)线性化技术的GaN射频功率放大器,使用基于物理的MIT虚拟源GaNFET (MVSG)模型演示了器件-电路相互作用。仔细选择了一些器件参数来研究它们对电路性能的影响,以及建议如何制造或选择更好的GaN器件用于射频功率放大器设计。该放大器在6GHz时实现11dB增益,在35.3dBm Psat时实现51%漏极效率,在10V电源电压下实现39dBm输出IP3。在这项工作中,研究表明,与直流、射频和热条件相关的物理器件参数会影响上述电路性能,特别是线性,并可用于将电路性能与特定器件级物理联系起来。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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