L. Berrojo, Isabel González, Fulvio Corno, M. Reorda, Giovanni Squillero, L. Entrena, C. López-Ongil
{"title":"An industrial environment for high-level fault-tolerant structures insertion and validation","authors":"L. Berrojo, Isabel González, Fulvio Corno, M. Reorda, Giovanni Squillero, L. Entrena, C. López-Ongil","doi":"10.1109/VTS.2002.1011143","DOIUrl":null,"url":null,"abstract":"When designing a VLSI circuits, most of the efforts are now performed at levels of abstractions higher than gate. Correspondingly to this clear trend, there is a growing request to tackle safety-critical issues directly at the RT-level. This paper presents a complete environment for considering safety issues at the RT level. The environment was implemented and tested by an industry for devising a sample safety-critical device. Designers were permitted to assess the effects of transient faults, automatically add fault-tolerant structures, and validate the results working on the same circuit descriptions and acting in a coherent framework. The evaluation showed the effectiveness of the proposed environment.","PeriodicalId":237007,"journal":{"name":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"29","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2002.1011143","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 29
Abstract
When designing a VLSI circuits, most of the efforts are now performed at levels of abstractions higher than gate. Correspondingly to this clear trend, there is a growing request to tackle safety-critical issues directly at the RT-level. This paper presents a complete environment for considering safety issues at the RT level. The environment was implemented and tested by an industry for devising a sample safety-critical device. Designers were permitted to assess the effects of transient faults, automatically add fault-tolerant structures, and validate the results working on the same circuit descriptions and acting in a coherent framework. The evaluation showed the effectiveness of the proposed environment.