An industrial environment for high-level fault-tolerant structures insertion and validation

L. Berrojo, Isabel González, Fulvio Corno, M. Reorda, Giovanni Squillero, L. Entrena, C. López-Ongil
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引用次数: 29

Abstract

When designing a VLSI circuits, most of the efforts are now performed at levels of abstractions higher than gate. Correspondingly to this clear trend, there is a growing request to tackle safety-critical issues directly at the RT-level. This paper presents a complete environment for considering safety issues at the RT level. The environment was implemented and tested by an industry for devising a sample safety-critical device. Designers were permitted to assess the effects of transient faults, automatically add fault-tolerant structures, and validate the results working on the same circuit descriptions and acting in a coherent framework. The evaluation showed the effectiveness of the proposed environment.
用于高级容错结构插入和验证的工业环境
在设计VLSI电路时,大多数工作现在都是在比栅极更高的抽象层次上进行的。与这一明显趋势相对应的是,越来越多的人要求直接在rt层面解决安全关键问题。本文为考虑RT级别的安全问题提供了一个完整的环境。该环境由一个行业实施和测试,以设计一个安全关键设备的样本。设计人员被允许评估瞬态故障的影响,自动添加容错结构,并验证在相同电路描述下工作的结果,并在一个连贯的框架中工作。评价结果表明所建议的环境是有效的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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