Anil Kunwar, M. Tonks, Shengyan Shang, Xueguan Song, Yunpeng Wang, Haitao Ma
{"title":"Quantitative polynomial free energy based phase field model for void motion and evolution in Sn under thermal gradient","authors":"Anil Kunwar, M. Tonks, Shengyan Shang, Xueguan Song, Yunpeng Wang, Haitao Ma","doi":"10.1109/ICEPT.2017.8046720","DOIUrl":null,"url":null,"abstract":"As the electronic packaging and fabrication industries for solar PV cells assembly or panels are making endeavours in using Pb-free solder joints, the reliability of these joints can be taken as an important research topic. Among several aspects, the control of void formation, growth and evolution in lead-free Sn-based solders can be achieved if the underlying mechanism for such phenomena can be modeled. This study employs a quantitative polynomial free energy based phase field method to model the motion and evolution of void in Sn material under thermal gradient. The effects of imposed temperature gradient to the overall migration rate and profile of the void has been assessed in the finite element model.","PeriodicalId":386197,"journal":{"name":"2017 18th International Conference on Electronic Packaging Technology (ICEPT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 18th International Conference on Electronic Packaging Technology (ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT.2017.8046720","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
As the electronic packaging and fabrication industries for solar PV cells assembly or panels are making endeavours in using Pb-free solder joints, the reliability of these joints can be taken as an important research topic. Among several aspects, the control of void formation, growth and evolution in lead-free Sn-based solders can be achieved if the underlying mechanism for such phenomena can be modeled. This study employs a quantitative polynomial free energy based phase field method to model the motion and evolution of void in Sn material under thermal gradient. The effects of imposed temperature gradient to the overall migration rate and profile of the void has been assessed in the finite element model.