{"title":"Digital Test Generation and Design for Testability","authors":"J. Grason, Andrew W. Nagle","doi":"10.1145/800139.804527","DOIUrl":null,"url":null,"abstract":"This paper is a tutorial intended primarily for individuals just getting started in digital testing. Basic concepts of testing are described, and the steps in the test development process are discussed. A pragmatic approach to test sequence generation is presented, oriented towards ICs interconnected on a board. Finally, design for testability techniques are described, with an emphasis on solving problems that appeared during the test generation discussion.","PeriodicalId":196513,"journal":{"name":"17th Design Automation Conference","volume":"95 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1980-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"17th Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/800139.804527","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 19
Abstract
This paper is a tutorial intended primarily for individuals just getting started in digital testing. Basic concepts of testing are described, and the steps in the test development process are discussed. A pragmatic approach to test sequence generation is presented, oriented towards ICs interconnected on a board. Finally, design for testability techniques are described, with an emphasis on solving problems that appeared during the test generation discussion.