{"title":"Radiation susceptibility modeling of passive PCBs using the complex images method","authors":"A. Badawi, A. Sebak","doi":"10.1109/ANTEM.2000.7851644","DOIUrl":null,"url":null,"abstract":"We have presented the usage of a full-wave electromagnetic numerical analysis tool to study radiation susceptibility of passive PCBs. The numerical tool uses a mixed potential integral equation combined with the efficient and accurate CIM. The MoM solution adopted is particularly efficient for analyzing radiation susceptibility, since the impedance matrix associated with the PCB does not have to be recalculated for different orientation or polarization of the incident field. Although the shown results are preliminary, the potential for using the tool towards more elaborate geometries and magnitudes of the incident fields is shown. Further results will be incorporated in the presentation.","PeriodicalId":416991,"journal":{"name":"Symposium on Antenna Technology and Applied Electromagnetics [ANTEM 2000]","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Symposium on Antenna Technology and Applied Electromagnetics [ANTEM 2000]","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ANTEM.2000.7851644","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We have presented the usage of a full-wave electromagnetic numerical analysis tool to study radiation susceptibility of passive PCBs. The numerical tool uses a mixed potential integral equation combined with the efficient and accurate CIM. The MoM solution adopted is particularly efficient for analyzing radiation susceptibility, since the impedance matrix associated with the PCB does not have to be recalculated for different orientation or polarization of the incident field. Although the shown results are preliminary, the potential for using the tool towards more elaborate geometries and magnitudes of the incident fields is shown. Further results will be incorporated in the presentation.