Fracture probability of MLCC in dependence of solder fillet height

J. Al Ahmar, E. Wiss, S. Wiese
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引用次数: 5

Abstract

This paper presents results of flex cracking experiments on Multilayer Ceramic Capacitors (MLCCs). The influence of solder fillet height, solder type and MLCC dimensions on the crack susceptibility of the component has been investigated. Subsequent statistical and metallographic analyses were carried out for more understanding of the failure mechanism. The statistical results show that the solder fillet height and solder type have a major influence on capacitors resistivity to cracks during bending. Components mounted with lead free solders have shown a higher resistivity to flex cracking. In some specimens delamination cracks on ceramic/termination interface were detected during microscopy analysis. Thermal shock cracks during cool down phase after soldering were also detected especially for capacitors with higher solder fillet.
MLCC的断裂概率与焊角高度的关系
本文介绍了多层陶瓷电容器(mlcc)的弯曲开裂实验结果。研究了焊角高度、焊料类型和MLCC尺寸对元件裂纹敏感性的影响。随后进行了统计和金相分析,以进一步了解破坏机制。统计结果表明,焊料角高度和焊料类型对电容器弯曲时的裂纹电阻率有重要影响。安装无铅焊料的组件显示出更高的弯曲开裂电阻率。在一些样品中,显微镜分析发现陶瓷/端接界面存在分层裂纹。在焊接后的冷却阶段也检测到热冲击裂纹,特别是对于具有较高焊点角的电容器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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