The End-of-Substructure (EoS) card for the Strip Tracker Upgrade of the ATLAS experiment

C. Wanotayaroj, H. Ceslik, Helmut Colbow, S. Díez, P. Goettlicher, A. Melnik, M. Stanitzki, Jonas Wolff
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引用次数: 3

Abstract

For the ATLAS experiment a new Silicon tracker is necessary for the High-Luminosity Upgrade of the LHC. The main building block for the strip tracker is a module which consists of a silicon sensor, readout ASICs and a hybrid PCB. Up to 28 modules are placed on long substructures. An End-of-Substructure (EoS) card provides common connections for data, commands and power to the off-detector systems. Prototypes has been developed based on the GBTx and GBT-SCA chip family and SFP+ optical links to understand the design issues, the behavior of the EoS and the detector level integration. Presented will be the design of the electronics, the exercised tests for electrical behavior, mechanical deformation and thermal behavior.
ATLAS实验中条带跟踪器升级的末端子结构(EoS)卡
在ATLAS实验中,需要一个新的硅跟踪器来实现LHC的高亮度升级。条带跟踪器的主要构建块是由硅传感器,读出asic和混合PCB组成的模块。多达28个模块放置在长子结构上。子结构末端(EoS)卡提供数据、命令和电源到离探测器系统的公共连接。基于GBTx和GBT-SCA芯片家族和SFP+光链路的原型已经开发出来,以了解设计问题,EoS的行为和探测器级集成。介绍了电子器件的设计、电性能、机械变形和热性能的测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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