Y. Kim, S. Yuan, R. Leon, A. Clark, C. Jagadish, M. Johnston, P. Burke, M. Gal, J. Zou, D. Cockayne, M. Phillips, M. A. Kalceff
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引用次数: 0
Abstract
A novel impurity-free interdiffusion (IFID) technique, namely, pulsed anodization and subsequent rapid thermal annealing, is applied to study GaAs/AlGaAs multiple quantum wires grown by metalorganic chemical vapour deposition on V-grooved GaAs substrates. Photoluminescence (PL) and cathodoluminescence (CL) emissions are observed from GaAs quantum wires. IFID increases both carrier confinement in quantum wires and the efficiency of excess carrier transfer from sidewall quantum wells to quantum wires, where the excess carriers are generated either by optical pumping (PL) or electron pumping (CL).