{"title":"Analysis of Chaotic Semiconductor Laser Diodes","authors":"J. Toomey, D. Kane","doi":"10.1109/COMMAD.2006.4429906","DOIUrl":null,"url":null,"abstract":"Developments in measurement equipment bandwidth and memory have allowed standard chaotic time series analysis of the multi-GHz output power fluctuations of a semiconductor laser operating chaotically. An investigation into the effect of noise shows the degradation of this analysis at low signal-to-noise ratios.","PeriodicalId":347755,"journal":{"name":"2006 Conference on Optoelectronic and Microelectronic Materials and Devices","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 Conference on Optoelectronic and Microelectronic Materials and Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/COMMAD.2006.4429906","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Developments in measurement equipment bandwidth and memory have allowed standard chaotic time series analysis of the multi-GHz output power fluctuations of a semiconductor laser operating chaotically. An investigation into the effect of noise shows the degradation of this analysis at low signal-to-noise ratios.