{"title":"Application of postprocessing in probe for automated model parameter extraction of photovoltaic panels","authors":"E. Gadjeva, Georgi Kunov","doi":"10.1109/SIITME.2017.8259896","DOIUrl":null,"url":null,"abstract":"An approach is proposed in the paper to parameter extraction of the single-diode model of photovoltaic panels. The extraction procedure is performed in the environment of the general-purpose circuit simulator Cadence PSpice and the graphical analyzer Cadence Probe. Parametric analysis with two independent parameters — the series resistance and the diode ideality constant, is used for the computer realization of the approach. As the simulator allows to vary only one parameter, the possibilities of the parametric analysis are extended to achieve simultaneous variation of two independent parameters. The implementation of parameter extraction procedure in standard circuit simulators allows its multiple use under different environmental conditions.","PeriodicalId":138347,"journal":{"name":"2017 IEEE 23rd International Symposium for Design and Technology in Electronic Packaging (SIITME)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 23rd International Symposium for Design and Technology in Electronic Packaging (SIITME)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIITME.2017.8259896","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
An approach is proposed in the paper to parameter extraction of the single-diode model of photovoltaic panels. The extraction procedure is performed in the environment of the general-purpose circuit simulator Cadence PSpice and the graphical analyzer Cadence Probe. Parametric analysis with two independent parameters — the series resistance and the diode ideality constant, is used for the computer realization of the approach. As the simulator allows to vary only one parameter, the possibilities of the parametric analysis are extended to achieve simultaneous variation of two independent parameters. The implementation of parameter extraction procedure in standard circuit simulators allows its multiple use under different environmental conditions.