Molecular level pathway to CIS deposition without post treatments

S. Menezes
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Abstract

CuInSe/sub 2/ (CIS) based thin-film devices could potentially provide high specific power for terrestrial or space power if they were fabricated at low temperatures on low-density polymer substrates. This paper presents a molecular level electrochemical approach that may permit direct deposition of morphologically homogenous, stoichiometric CIS-alloy absorber layers without high temperature post treatments. The paper investigates the effects of deposition parameters by monitoring voltammetric characteristics, pulsed flow/deposition waveforms and film composition with different deposition system configurations. It distinguishes the CIS formation reaction mechanisms in bulk and thin layer electrolytes and identifies two new deposition parameters to increase the content of difficult-to-electrodeposit metals like In and Ga. The results provide directions for low-temperature synthesis of device quality absorber layers for efficient, inexpensive PV modules.
未经后处理的CIS沉积的分子水平途径
CuInSe/sub 2/ (CIS)薄膜器件如果在低温下在低密度聚合物衬底上制造,可能会为地面或空间电源提供高比功率。本文提出了一种分子水平的电化学方法,可以直接沉积形态均匀的化学计量cis合金吸收层,而无需高温后处理。本文通过监测不同沉积系统配置下的伏安特性、脉冲流/沉积波形和薄膜组成来研究沉积参数的影响。区分了大块和薄层电解质中CIS的形成反应机理,并确定了两个新的沉积参数,以提高难电沉积金属如in和Ga的含量。研究结果为低温合成高效、廉价光伏组件的器件级吸收层提供了方向。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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