M. S. Shekar, B. J. Baliga, M. Nandakumar, S. Tandon, A. Reisman
{"title":"Experimental demonstration of the emitter switched thyristor","authors":"M. S. Shekar, B. J. Baliga, M. Nandakumar, S. Tandon, A. Reisman","doi":"10.1109/ISPSD.1991.146082","DOIUrl":null,"url":null,"abstract":"The operation of 600 V forward blocking emitter switched thyristors (ESTs) has been experimentally demonstrated. The devices were fabricated using an IGBT baseline process with six masking steps. The forward I-V and turnoff characteristics have been measured and corroborated through two-dimensional numerical simulations. The output characteristics are close to a thyristor with an additional drop of about 0.5 V across the lateral MOSFET. Switching tests were performed up to a current density of 1000 A/cm/sup 2/ on single unit cells, and the measured turn-off times were about 7 mu s. A unique feature of the EST which is not seen in any other MOS-gated thyristor devices is saturation of thyristor current even after latch up of the main thyristor. This feature is very important for applications requiring current limiting and short circuit protection.<<ETX>>","PeriodicalId":127986,"journal":{"name":"[1991] Proceedings of the 3rd International Symposium on Power Semiconductor Devices and ICs","volume":"92 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Proceedings of the 3rd International Symposium on Power Semiconductor Devices and ICs","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1991.146082","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
The operation of 600 V forward blocking emitter switched thyristors (ESTs) has been experimentally demonstrated. The devices were fabricated using an IGBT baseline process with six masking steps. The forward I-V and turnoff characteristics have been measured and corroborated through two-dimensional numerical simulations. The output characteristics are close to a thyristor with an additional drop of about 0.5 V across the lateral MOSFET. Switching tests were performed up to a current density of 1000 A/cm/sup 2/ on single unit cells, and the measured turn-off times were about 7 mu s. A unique feature of the EST which is not seen in any other MOS-gated thyristor devices is saturation of thyristor current even after latch up of the main thyristor. This feature is very important for applications requiring current limiting and short circuit protection.<>