Radiation effects in analog CMOS analog-to-digital converters

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference Pub Date : 1996-07-19 DOI:10.1109/REDW.1996.574182

T. Turflinger, M. Davey, J. Bings

引用次数: 13

Abstract

Analog CMOS circuitry is becoming common in the marketplace. Two commercial ADC are tested in the total dose and dose rate environments. Test results and applicability to system use are discussed.

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模拟CMOS模数转换器中的辐射效应

模拟CMOS电路在市场上变得越来越普遍。在总剂量和剂量率环境下测试了两种商用ADC。讨论了测试结果和系统使用的适用性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference

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