Voltage margins identification on commercial x86-64 multicore microprocessors

G. Papadimitriou, Manolis Kaliorakis, Athanasios Chatzidimitriou, Charalampos Magdalinos, D. Gizopoulos
{"title":"Voltage margins identification on commercial x86-64 multicore microprocessors","authors":"G. Papadimitriou, Manolis Kaliorakis, Athanasios Chatzidimitriou, Charalampos Magdalinos, D. Gizopoulos","doi":"10.1109/IOLTS.2017.8046198","DOIUrl":null,"url":null,"abstract":"In this paper, we explore the pessimistic voltage guardbands of two multicore x86-64 microprocessor chips that belong to different microarchitectures (one ultra-low power and one high-performance microprocessor), when programs are executed on individual cores of the CPU chips. We also examine the energy and temperature gains as positive effects of lowering the voltage in both chips while preserving the functional correctness of programs. The behavior of the cores was examined executing 8 different workloads from the SPEC CPU2006 suite. Our differential experimental study is performed on two state-of-the-art x86-64 microprocessors: an ultra-low power Intel Core i5-4200U and a high-performance Intel Core i7-3970X. Based on the results, the cores on each microprocessor chip behave differently for different workloads when undervolted, and the voltage guardbands are more than 15% below the nominal voltage levels. We show that the energy efficiency can be increased by a maximum of 20% and the reduction of temperature can be up to 25%.","PeriodicalId":233462,"journal":{"name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2017.8046198","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20

Abstract

In this paper, we explore the pessimistic voltage guardbands of two multicore x86-64 microprocessor chips that belong to different microarchitectures (one ultra-low power and one high-performance microprocessor), when programs are executed on individual cores of the CPU chips. We also examine the energy and temperature gains as positive effects of lowering the voltage in both chips while preserving the functional correctness of programs. The behavior of the cores was examined executing 8 different workloads from the SPEC CPU2006 suite. Our differential experimental study is performed on two state-of-the-art x86-64 microprocessors: an ultra-low power Intel Core i5-4200U and a high-performance Intel Core i7-3970X. Based on the results, the cores on each microprocessor chip behave differently for different workloads when undervolted, and the voltage guardbands are more than 15% below the nominal voltage levels. We show that the energy efficiency can be increased by a maximum of 20% and the reduction of temperature can be up to 25%.
商用x86-64多核微处理器的电压裕度识别
在本文中,我们探讨了属于不同微架构的两个多核x86-64微处理器芯片(一个超低功耗和一个高性能微处理器),当程序在CPU芯片的单个内核上执行时的悲观电压保护带。我们还研究了能量和温度增益作为降低两个芯片电压的积极影响,同时保持程序的功能正确性。在SPEC CPU2006套件中执行8种不同工作负载时,对内核的行为进行了检查。我们的差异实验研究是在两个最先进的x86-64微处理器上进行的:一个超低功耗的Intel Core i5-4200U和一个高性能的Intel Core i7-3970X。根据结果,当欠压时,每个微处理器芯片上的内核在不同的工作负载下表现不同,并且电压保护带比标称电压水平低15%以上。我们表明,能源效率最多可提高20%,温度降低可达25%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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