New Semiconductor Structure Capacity Measurement Method using the Differential Amplifier

International Workshops and Tutorials on Electron Devices and Materials Pub Date : 2006-07-01 DOI:10.1109/SIBEDM.2006.231660

N.G. Zaycev

引用次数: 0

Abstract

A new method of measurement of capacity of semiconductor structures is presented.. The methodic design reasoning is shown. The developed method has some advantages over the balance schemes and schemes of capacity divisor. It has linear capacity-voltage relationship on the output of measuring circuit

查看原文本刊更多论文

利用差分放大器测量半导体结构容量的新方法

提出了一种测量半导体结构容量的新方法。给出了系统的设计推理。该方法与平衡方案和容量除数方案相比，具有一定的优越性。它在测量电路的输出端呈线性容压关系

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

International Workshops and Tutorials on Electron Devices and Materials

自引率

0.00%

发文量