Design and Simulation of InGaP/SiGe Dual-Junction Solar Cell System with Two Graded Buffer Regions Si0.18Ge0.82 and Optimizing Base Layer Si0.18Ge0.82

Hojatollah Poudineh, Mohammad Reza Ghorbani Fard
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引用次数: 0

Abstract

In this work, a dual-junction InGaP/SiGe solar cell system with two graded buffer regions Si0.18Ge0.82 is proposed. The focus is on the effect of optimizing the SiGe Base layer. The Silvaco ATLAS device simulator is used to simulate 1 sun illumination under standard AM1.5G spectrum. Also, various performance parameters such as open-circuit voltage, short-circuit current density, Efficiency, and Fill Factor are analyzed and compared with the published results from recent literature. For the proposed structure, the following parameters are obtained for the base layer Si0.18Ge0.82: Ish = 20.2995 mA/cm2, Voc= 2.0574 V, η= 36.54 % and FF = 87.55 %.
具有两个梯度缓冲带Si0.18Ge0.82和优化基层Si0.18Ge0.82的InGaP/SiGe双结太阳能电池系统的设计与仿真
本文提出了一种具有两个梯度缓冲区域Si0.18Ge0.82的双结InGaP/SiGe太阳能电池系统。重点是优化SiGe基础层的效果。使用Silvaco ATLAS器件模拟器模拟标准AM1.5G光谱下的1次太阳光照。此外,还分析了各种性能参数,如开路电压、短路电流密度、效率和填充系数,并与最近发表的文献结果进行了比较。对于所提出的结构,基材Si0.18Ge0.82的参数为:Ish = 20.2995 mA/cm2, Voc= 2.0574 V, η= 36.54%, FF = 87.55%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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