D. Jiménez, J. Sáenz, B. Iñíguez, J. Suñé, L. Marsal, J. Pallarès
{"title":"Compact modeling of nanoscale MOSFETs in the ballistic limit","authors":"D. Jiménez, J. Sáenz, B. Iñíguez, J. Suñé, L. Marsal, J. Pallarès","doi":"10.1109/ESSDERC.2003.1256842","DOIUrl":null,"url":null,"abstract":"We present a compact model based on the Landauer transmission theory for the silicon quantum wire/well metal-oxide-semiconductor field effect transistor (MOSFET) working in the ballistic limit. This model captures the static current-voltage characteristics in all the operation regimes, below and above threshold voltage. The model provides a basic framework to account for the electronic transport in MOSFETs, being easily adaptable to gate structures as the double-gate (DG) or gate-all-around (GAA). Numerical simulations based on the proposed model have been compared with quantum mechanical self-consistent simulations and experimental results, with good agreement.","PeriodicalId":350452,"journal":{"name":"ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.2003.1256842","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
We present a compact model based on the Landauer transmission theory for the silicon quantum wire/well metal-oxide-semiconductor field effect transistor (MOSFET) working in the ballistic limit. This model captures the static current-voltage characteristics in all the operation regimes, below and above threshold voltage. The model provides a basic framework to account for the electronic transport in MOSFETs, being easily adaptable to gate structures as the double-gate (DG) or gate-all-around (GAA). Numerical simulations based on the proposed model have been compared with quantum mechanical self-consistent simulations and experimental results, with good agreement.