A 16-bit 16MS/s SAR ADC with on-chip calibration in 55nm CMOS

Junhua Shen, A. Shikata, Lalinda D. Fernando, Ned Guthrie, Baozhen Chen, Mark Maddox, Nikhil Mascarenhas, Ron Kapusta, M. Coln
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引用次数: 19

Abstract

This paper presents a SAR ADC that is much smaller and faster than the recently reported precision (16-bit and beyond) SAR ADCs [1, 2, 3]. In addition, it features low input capacitance and an efficient on-chip foreground calibration algorithm to fix bit weight errors. Several other enabling techniques are also used, including signal independent reference switching using reservoir capacitors to improve speed and reduce area, LSB repeats and ADC residue measurement to improve efficiency. The prototype achieves 97.5dB SFDR while operating at 16MS/s and consumes 16.3mW. It was fabricated in 55nm CMOS and occupies 0.55mm2.
一个16位16MS/s SAR ADC,采用55nm CMOS片上校准
本文提出了一种比最近报道的精度(16位及以上)SAR ADC更小、更快的SAR ADC[1,2,3]。此外,它还具有低输入电容和有效的片上前景校准算法来固定位权误差。此外,还使用了其他几种使能技术,包括使用储层电容器进行信号独立参考开关以提高速度和减少面积,LSB重复和ADC残余测量以提高效率。该样机在16MS/s工作时实现了97.5dB SFDR,功耗为16.3mW。它采用55nm CMOS工艺制造,占地0.55mm2。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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