High-speed Sampling System in CMOS

2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC) Pub Date : 2018-10-01 DOI:10.1109/NORCHIP.2018.8573459

E. Ulvestad, K. G. Kjelgård, T. M. Khanshan, D. Wisland, T. Lande

引用次数: 0

Abstract

In this paper we will present a high-speed sampling system intended for use in a depth selective or depth resolved spectroscopic LIDAR for transcutanuous blood assessment. A continuous-time (CT) sampling solution enabling sampling rates close to 100 GHz, close to two orders of magnitude faster than standard clocked systems. Based on experimental verification in 90nm CMOS technology, opportunities and limitations of CT sampling systems are analyzed.

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CMOS高速采样系统

在本文中，我们将提出一种高速采样系统，用于深度选择或深度分辨光谱激光雷达经皮血液评估。连续时间(CT)采样解决方案，使采样率接近100ghz，比标准时钟系统快近两个数量级。基于90纳米CMOS技术的实验验证，分析了CT采样系统的机遇和局限性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)

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