Dual Referencing Simulation Approach on High Speed Interconnects USB3.2 (10Gbps)

Li Wern Chew, Paik Wen Ong
{"title":"Dual Referencing Simulation Approach on High Speed Interconnects USB3.2 (10Gbps)","authors":"Li Wern Chew, Paik Wen Ong","doi":"10.23919/ICEP55381.2022.9795442","DOIUrl":null,"url":null,"abstract":"Despite our computing technology and platform design are trending toward higher speeds for better performance, on the contrary, the printed circuit board (PCB) form factor needs to scale smaller and thinner to allow for bigger battery for battery life improvement. Due to this, layout design with dual referenced (SIG-PWR or GND-SIG-PWR) stack-up could not be avoided at all due to the limitation that we have on routing spaces or routing layers. In this paper, signal and power integrity (SIPI) co-simulation approach on USB3.2 with dual referencing is described and discussed. The co-sim approach is carried out using Advanced Design System (ADS) tool in time-domain where the power noise is directly injected to the power plane and its noise coupling impact on USB3.2 eye opening at the receiver end is then observed.","PeriodicalId":413776,"journal":{"name":"2022 International Conference on Electronics Packaging (ICEP)","volume":"130 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 International Conference on Electronics Packaging (ICEP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ICEP55381.2022.9795442","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Despite our computing technology and platform design are trending toward higher speeds for better performance, on the contrary, the printed circuit board (PCB) form factor needs to scale smaller and thinner to allow for bigger battery for battery life improvement. Due to this, layout design with dual referenced (SIG-PWR or GND-SIG-PWR) stack-up could not be avoided at all due to the limitation that we have on routing spaces or routing layers. In this paper, signal and power integrity (SIPI) co-simulation approach on USB3.2 with dual referencing is described and discussed. The co-sim approach is carried out using Advanced Design System (ADS) tool in time-domain where the power noise is directly injected to the power plane and its noise coupling impact on USB3.2 eye opening at the receiver end is then observed.
高速互连USB3.2 (10Gbps)双参考仿真方法
尽管我们的计算技术和平台设计趋向于更高的速度以获得更好的性能,但相反,印刷电路板(PCB)的外形因素需要更小更薄,以允许更大的电池以提高电池寿命。因此,由于我们在路由空间或路由层上的限制,无法避免使用双引用(SIG-PWR或GND-SIG-PWR)堆叠的布局设计。本文描述并讨论了双参考USB3.2的信号与功率完整性(SIPI)联合仿真方法。采用时域高级设计系统(ADS)工具进行co-sim方法,将功率噪声直接注入功率平面,然后观察其噪声耦合对接收端USB3.2睁眼的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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