Damage Prediction and Remaining Useful Lifetime Assessment of a Discrete Power Electronic Component Using a Multi-Layer Perceptron based on Mission Profile Data
{"title":"Damage Prediction and Remaining Useful Lifetime Assessment of a Discrete Power Electronic Component Using a Multi-Layer Perceptron based on Mission Profile Data","authors":"Darshankumar Bhat, S. Muench, M. Roellig","doi":"10.1109/ISSE54558.2022.9812777","DOIUrl":null,"url":null,"abstract":"In this contribution, an automated routine is presented to assess the reliability of a discrete power electronic component used In electric bikes based on a data driven approach. Real temperature profiles are acquired from the field under different loading conditions of electric bikes and its features are extracted using a custom algorithm. A Multilayer Perceptron trained with synthetic but realistic temperature loads is used to predict creep strains induced in the solder joints of a chip resistor. In addition, the remaining useful lifetime has been evaluated at various stages of the mission profile. This methodology provided a solution for real-time capable remaining useful lifetime estimation method.","PeriodicalId":413385,"journal":{"name":"2022 45th International Spring Seminar on Electronics Technology (ISSE)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 45th International Spring Seminar on Electronics Technology (ISSE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSE54558.2022.9812777","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
In this contribution, an automated routine is presented to assess the reliability of a discrete power electronic component used In electric bikes based on a data driven approach. Real temperature profiles are acquired from the field under different loading conditions of electric bikes and its features are extracted using a custom algorithm. A Multilayer Perceptron trained with synthetic but realistic temperature loads is used to predict creep strains induced in the solder joints of a chip resistor. In addition, the remaining useful lifetime has been evaluated at various stages of the mission profile. This methodology provided a solution for real-time capable remaining useful lifetime estimation method.