Z. Sauli, V. Retnasamy, W. Norhaimi, S. Taniselass, T. S. Ong, R. Vairavan
{"title":"Gold and Copper Ball Bond Shear Stress Comparison At Different Shear Tool Heights","authors":"Z. Sauli, V. Retnasamy, W. Norhaimi, S. Taniselass, T. S. Ong, R. Vairavan","doi":"10.1109/CIMSIM.2012.84","DOIUrl":null,"url":null,"abstract":"The reliability of wire bond is very significant due to its function of providing interconnection and signal passage to the integrated circuit. Wire bond shear test are utilized to evaluate the reliability and bond strength of bonded wires. In this study, the wire bond shear test is simulated. The effects of shear tool height on the stress response of bonded wires are examined through simulation. Ansys version 11 was utilized for the simulation. The stress response of two wire materials, gold(Au) and copper(Cu) at varied shear tool height during the wire bond shear test were evaluated.A 3D non-linear finite element model was developed for the simulation. The shear tool height of 0.29μm and 8.71μm were employed in this study.The simulation results shows that shear tool height has a significant effects on the stress response of bonded wires.","PeriodicalId":435030,"journal":{"name":"2012 Fourth International Conference on Computational Intelligence, Modelling and Simulation","volume":"117 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 Fourth International Conference on Computational Intelligence, Modelling and Simulation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CIMSIM.2012.84","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The reliability of wire bond is very significant due to its function of providing interconnection and signal passage to the integrated circuit. Wire bond shear test are utilized to evaluate the reliability and bond strength of bonded wires. In this study, the wire bond shear test is simulated. The effects of shear tool height on the stress response of bonded wires are examined through simulation. Ansys version 11 was utilized for the simulation. The stress response of two wire materials, gold(Au) and copper(Cu) at varied shear tool height during the wire bond shear test were evaluated.A 3D non-linear finite element model was developed for the simulation. The shear tool height of 0.29μm and 8.71μm were employed in this study.The simulation results shows that shear tool height has a significant effects on the stress response of bonded wires.
由于线键为集成电路提供互连和信号通道的功能,因此线键的可靠性非常重要。采用钢丝粘结剪切试验对钢丝的可靠性和粘结强度进行了评价。在本研究中,模拟了钢丝粘结剪切试验。通过仿真研究了刀具高度对焊丝应力响应的影响。采用Ansys version 11进行仿真。研究了金(Au)和铜(Cu)两种线材在不同剪切工具高度下的应力响应。建立了三维非线性有限元模型进行仿真。剪切工具高度分别为0.29μm和8.71μm。仿真结果表明,刀具高度对焊丝的应力响应有显著影响。