A case study of ir-drop in structured at-speed testing

International Test Conference, 2003. Proceedings. ITC 2003. Pub Date : 2003-09-30 DOI:10.1109/TEST.2003.1271098

Jayashree Saxena, K. Butler, Vinay B. Jayaram, Subhendu Kundu, N. Arvind, Pravin Sreeprakash, Manfred Hachinger

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引用次数: 410

Abstract

At-speed test has become a requirement in IC tech- nologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special chal- lenges to the successful application of structural at- speed tests. In this paper we characterize these prob- lems on commercial ASICs in order to understand how to implement more effective solutions. consumption. Depending on such parameters as gate count, DFT strategies, package type, and other fac- tors, the impact of this problem can range from non- existent to severe. In this paper, we discuss the prac- tical issues associated with power consumption during at-speed tests. We begin by delineating in more detail the nature of power-related phenomena encountered in structured speed tests. We talk about various de- sign features that can be applied to somewhat miti- gate test mode power dissipation. In Section 2, we give a more precise definition of the IR-drop problem which is the focus of this pa- per. We compare IR-drop in slow speed and at-speed structural tests, and also compare it with functional IR-drop. We narrow the focus further to the topic of toggle activity or "switching density" during struc- tured at-speed tests. In Section 3.4 we describe the notion of "quiet" patterns and how they are gener- ated. We follow up with a report of the results we have obtained in experimentation on industrial ASIC designs. Finally we give our suggestions for future work in this area and conclude the paper.

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结构高速测试中空气滴入的案例研究

高速测试已成为180nm以下集成电路技术的一项要求。不幸的是，试验模式切换活性和红外下降对结构高速试验的成功应用提出了特殊的挑战。在本文中，我们在商用asic上描述了这些问题，以便了解如何实现更有效的解决方案。消费。根据门数、DFT策略、封装类型和其他因素等参数，这个问题的影响可以从不存在到严重。在本文中，我们讨论了在高速测试中与功耗相关的实际问题。我们首先更详细地描述结构化速度测试中遇到的与功率相关的现象的性质。我们讨论了可以应用于半栅测试模式功耗的各种设计特征。在第2节中，我们给出了更精确的ir下降问题的定义，这是本文的重点。我们比较了慢速和高速结构测试中的红外下降，并将其与功能性红外下降进行了比较。我们进一步将焦点缩小到结构高速测试期间的切换活动或“切换密度”主题。在第3.4节中，我们描述了“安静”模式的概念以及它们是如何生成的。我们随后报告了我们在工业ASIC设计实验中获得的结果。最后对今后的工作提出了建议，并对全文进行了总结。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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International Test Conference, 2003. Proceedings. ITC 2003.

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