Field emission enhancement achieved by selective multi-walled carbon nanotubes deposition over silicon microstructures

M. Dantas, E. Galeazzo, H. Peres, F. J. Ramirez-Fernandez
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引用次数: 2

Abstract

Field Emission (FE) devices have been studied due to their attractive characteristics: they are cold cathode electron emitters, and can be used as ionization sources for several applications. However, miniaturization, emission efficiency, and integration with electronic circuits are aspects that need to be enhanced. This paper reports silicon (Si) FE devices successfully optimized by the combination of miniaturized structures and multi-walled carbon nanotubes (MWCNT). MWCNT were deposited over Si microtip arrays by electrophoretic deposition (EPD), and a selective coating without additional lithographic masks was achieved with appropriate process parameters. Our devices were electrically analyzed by means of macroscopic electric field (E), which demonstrated to be efficient for experimental performance comparison among samples. FE devices covered with CNT showed an E reduction up to 80% for a given current, which indicates a considerable enhancement in electron emission efficiency. We conclude that the appropriate combination of microstructures and CNT deposition parameters is suitable for the development of efficient and cost-effective integrated FE devices.
选择性多壁碳纳米管沉积在硅微结构上实现场发射增强
场发射(FE)器件由于其吸引人的特性而受到研究:它们是冷阴极电子发射器,并且可以用作多种应用的电离源。然而,小型化、发射效率和与电子电路的集成是需要加强的方面。本文报道了将微型化结构与多壁碳纳米管(MWCNT)相结合,成功地优化了硅(Si) FE器件。采用电泳沉积法(EPD)在硅微尖阵列上沉积MWCNT,并在适当的工艺参数下实现了不附加光刻掩模的选择性涂层。我们的器件通过宏观电场(E)进行电分析,证明了样品之间的实验性能比较是有效的。在给定电流下,覆盖碳纳米管的FE器件显示出高达80%的E降低,这表明电子发射效率有相当大的提高。我们得出结论,适当的微观结构和碳纳米管沉积参数的组合适合于开发高效和经济的集成有限元器件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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