A deep analysis of SEU consequences in the internal memory of LEON3 processor

Abstract

This paper presents an analysis of the effects of Single Event Upset (SEU) into the internal memory of Aeroflex Gaisler LEON3 processor which is a 32-bit synthesizable processor based on SPARC V8 architecture implemented in an FPGA. A new software methodology allowing fault injection is explored and illustrated in order to classify the faulty behaviors while executing an AES benchmark. An exhaustive fault-injection campaign was performed to test the behavior of LEON3 processor.