{"title":"A new Bulk Built-In Current Sensing circuit for single-event transient detection","authors":"Zhichao Zhang, Tao Wang, Li Chen, Jinsheng Yang","doi":"10.1109/CCECE.2010.5575124","DOIUrl":null,"url":null,"abstract":"This paper introduces a new design for the Bulk Built-In Current Sensor (BICS) capable of detecting the single-event transients (SET) due to a particle strike in the integrated circuits. An 4-bit multiplier is used as a case study. The simulation results indicate that efficiency and applicability of the Bulk-BICS of this work improves while the power consumption and area overhead reduce greatly.","PeriodicalId":325063,"journal":{"name":"CCECE 2010","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"35","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"CCECE 2010","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCECE.2010.5575124","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 35
Abstract
This paper introduces a new design for the Bulk Built-In Current Sensor (BICS) capable of detecting the single-event transients (SET) due to a particle strike in the integrated circuits. An 4-bit multiplier is used as a case study. The simulation results indicate that efficiency and applicability of the Bulk-BICS of this work improves while the power consumption and area overhead reduce greatly.