A new Bulk Built-In Current Sensing circuit for single-event transient detection

Zhichao Zhang, Tao Wang, Li Chen, Jinsheng Yang
{"title":"A new Bulk Built-In Current Sensing circuit for single-event transient detection","authors":"Zhichao Zhang, Tao Wang, Li Chen, Jinsheng Yang","doi":"10.1109/CCECE.2010.5575124","DOIUrl":null,"url":null,"abstract":"This paper introduces a new design for the Bulk Built-In Current Sensor (BICS) capable of detecting the single-event transients (SET) due to a particle strike in the integrated circuits. An 4-bit multiplier is used as a case study. The simulation results indicate that efficiency and applicability of the Bulk-BICS of this work improves while the power consumption and area overhead reduce greatly.","PeriodicalId":325063,"journal":{"name":"CCECE 2010","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"35","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"CCECE 2010","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCECE.2010.5575124","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 35

Abstract

This paper introduces a new design for the Bulk Built-In Current Sensor (BICS) capable of detecting the single-event transients (SET) due to a particle strike in the integrated circuits. An 4-bit multiplier is used as a case study. The simulation results indicate that efficiency and applicability of the Bulk-BICS of this work improves while the power consumption and area overhead reduce greatly.
一种用于单事件瞬态检测的新型内置电流传感电路
本文介绍了一种能够检测集成电路中粒子撞击引起的单事件瞬态电流传感器(BICS)的设计。使用4位乘法器作为案例研究。仿真结果表明,该方法提高了Bulk-BICS的效率和适用性,大大降低了功耗和面积开销。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信