A generalized time-series data format for efficient exchange, archiving, and analysis of reliability data

Abstract

We present a generalized time-series data format for reliability data that can be used for all the standard degradation and failure data typically encountered in reliability studies in the semiconductor industry. The format, which we call the Time-Series Data Format or TSDF, allows storage of all metadata associated with a data set, including device under test (DUT) information, split information, stress conditions, measurement definitions, as well as degradation data, and if present, full IV curve data. TSDF can be the foundation of a flexible and useful reliability data analysis platform. It is presented here as a proposal, with the understanding that a common data format would be useful to the reliability community. Suggestions for improvements to the format are welcome.