Built-in current sensor for IDDQ test

Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004) Pub Date : 2004-04-05 DOI:10.1109/DBT.2004.1408945

Bin Xue, D. Walker

引用次数: 25

Abstract

A practical built-in current sensor (BICS) design is described in this paper. This sensor system is able to monitor the IDDQ at a resolution level of 10 muA. This system can translate the current level into a digital signal, with scan chain readout. There is no system performance degradation for this sensor and its power dissipation is kept at a very low level. With the help of a self-calibration circuit, the sensor can maintain its accuracy and achieve a clock rate of over 1 GHz, for a measurement time of a few milliseconds

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内置电流传感器IDDQ测试

介绍了一种实用的内置电流传感器(BICS)设计。该传感器系统能够以10mua的分辨率水平监测IDDQ。该系统可将电流电平转换为数字信号，并具有扫描链读出功能。该传感器无系统性能下降，功耗保持在很低的水平。在自校准电路的帮助下，传感器可以保持其精度并实现超过1 GHz的时钟速率，测量时间为几毫秒

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004)

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