Automatic test pattern generation method of flash memory based on Labview

Abstract

Flash memory is widely used in many fields, but there are still some problems with the generation of test pattern. The working and testing method of the memory is complex, for large capacity memory, the workload of generating a test pattern by the method of using manually is prohibitive. And Simulation files may not be obtained from design companies by the reason of protection of intellectual property rights. Thus, a Flash memory test pattern automatic generation method was studied; a generator is developed based on Labview. In this method, information of pins can be defined, information of command, address and data pins can be setup, and the length of a single vector can be identified. Specifications of internal blocks and pages are also defined, length of pattern which used for erasure, read and write operation is calculated. Finally, test pattern can be generated according to the selected algorithm, pins information and internal structure information. The results indicate that the proposed method is valid for functional test of Flash memory.