An advanced design system: design capture, functional test generation, mixed level simulation and logic synthesis [VLSI]

M. Sekine, S. Ueda, M. Kogure, T. Takei, Masami Aihara, E. Yano, K. Iwawaki, K. Yamagishi, K. Kohno, T. Kitahara, T. Fukasawa
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引用次数: 7

Abstract

A VLSI CAD (computer-aided design) system has been enhanced by adding several tools. It consists of a mixed-level simulator, logic synthesis, layout systems, a functional test generation assistance, etc. The functional simulator, which is on a laptop PC, is for a 50 K-gate class LSI, and the mixed level simulator, which is on an EWS and a mainframe, is for above-100 K-gate VLSI. In-house designer groups have reported that the design time is cut in half using the system. A functional schematic capture provides a more friendly user interface than a logic schematic capture. A novel approach to functional test generation is also provided
先进的设计系统:设计捕获、功能测试生成、混合电平仿真和逻辑综合[VLSI]
一个VLSI CAD(计算机辅助设计)系统已经增强了几个工具。它由混合级模拟器、逻辑综合、布局系统、功能测试生成辅助等组成。在笔记本电脑上的功能模拟器适用于50 k门级的大规模集成电路,而在EWS和大型机上的混合电平模拟器适用于100 k门以上的大规模集成电路。内部设计师团队报告说,使用该系统的设计时间缩短了一半。功能原理图捕获提供了比逻辑原理图捕获更友好的用户界面。提出了一种新的功能测试生成方法
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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