Graphene Top-gated Mos2 Phototransistors

Y. Sheng, Xinyu Chen, Fuyou Liao, Jianan Deng, J. Wan, W. Bao
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Abstract

MoS2 phototransistor has been widely investigated for its high sensitivity to light ranging from visible to near-infrared owing to the layer-dependent bandgap of MoS2. However, most of the devices in the previous studies employed a back-gate device structure, which limits its future practical application. Here, we take advantage of the high transparency of atomically thin graphene membrane to propose a top-gate phototransistor structure, in which the graphene acts as the top-gate electrode. Such MoS2 photodetector exhibits ultrahigh responsivity reaching 1.4×105 AW−1 under the 550 nm incident light. The spectral response is also studied under the illumination of wavelength from 300 nm to 1000 nm. Other factors correlated with the lifetime of photogenerated carriers, including source-drain bias, gate bias, incident light intensity, are also systematically investigated.
石墨烯顶门控Mos2光电晶体管
由于二硫化钼的层间带隙依赖,其对可见光到近红外光的高灵敏度得到了广泛的研究。然而,以往研究的器件大多采用后门器件结构,限制了其未来的实际应用。本文利用石墨烯原子薄膜的高透明度,提出了一种以石墨烯作为顶栅电极的顶栅光电晶体管结构。该MoS2光电探测器在550 nm入射光下具有超高的响应率,达到1.4×105 AW−1。研究了在300 ~ 1000 nm波长照射下的光谱响应。与光生载流子寿命相关的其他因素,包括源漏偏置、栅偏置、入射光强度,也进行了系统的研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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