A Compact eFUSE Programmable Array Memory for SOI CMOS

J. Safran, A. Leslie, G. Fredeman, C. Kothandaraman, A. Cestero, Xiang Chen, R. Rajeevakumar, Deok-kee Kim, Y. Li, D. Moy, N. Robson, T. Kirihata, S. Iyer
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引用次数: 30

Abstract

Demonstrating a >10X density increase over traditional VLSI fuse circuits, a compact eFUSE programmable array memory configured as a 4 Kb one-time programmable ROM (OTPROM) is presented using a 6.2 mum2 NiSix silicide electromigration ITIR cell in 65 nm SOI CMOS. A 20 mus programming time at 1.5 V is achieved by asymmetrical scaling of the fuse and a shared differential sensing scheme. Having zero process cost adder, eFUSE is fully compatible with standard VLSI manufacturing.
一种用于SOI CMOS的紧凑型eFUSE可编程阵列存储器
采用6.2 mum2 NiSix硅化电迁移ITIR电池,在65nm SOI CMOS中提出了一种紧凑的eFUSE可编程阵列存储器,配置为4kb的一次性可编程ROM (OTPROM),比传统的VLSI保险丝电路的密度增加了>10倍。在1.5 V下的20 mus编程时间是通过不对称缩放保险丝和共享差分传感方案实现的。eFUSE具有零工艺成本加法,完全兼容标准VLSI制造。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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