Asymptotic Simulation Methods as Forward Models in Multilayer Material Characterization Applications

Abstract

In this paper a geometrical optics and a physical optics approach are presented as forward models for multilayer problems. The simulation results are validated by measurements and a full wave simulation. The used measurement system is based on a frequency modulated continuous wave radar operating from 68GHz to 92GHz. A matching pursuit decomposition is used to evaluate the relative permittivity and the thickness of the layers to compare the different simulations and the measurement.