{"title":"A more effective C/sub EFF/","authors":"S. Nassif, Zhuo Li","doi":"10.1109/ISQED.2005.10","DOIUrl":null,"url":null,"abstract":"Precise chip-level timing requires careful modeling of the interaction between logic drivers and interconnect. Existing static-timing analysis methodologies generate models for drivers with lumped capacitive loads. This necessitates the translation of the actual loading and interconnect parasitics into a single effective capacitance. Existing approaches to perform that translation are either iterative in nature or involve iterative procedure to solve non-closed form equations and thus costly in CPU time. This paper presents a new accurate and simple closed form approach to deal with effective capacitance.","PeriodicalId":333840,"journal":{"name":"Sixth international symposium on quality electronic design (isqed'05)","volume":"90 4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Sixth international symposium on quality electronic design (isqed'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2005.10","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Precise chip-level timing requires careful modeling of the interaction between logic drivers and interconnect. Existing static-timing analysis methodologies generate models for drivers with lumped capacitive loads. This necessitates the translation of the actual loading and interconnect parasitics into a single effective capacitance. Existing approaches to perform that translation are either iterative in nature or involve iterative procedure to solve non-closed form equations and thus costly in CPU time. This paper presents a new accurate and simple closed form approach to deal with effective capacitance.