{"title":"RAMSES-FT: a fault simulator for flash memory testing and diagnostics","authors":"Kuo-Liang Cheng, Jen-Chieh Yeh, Chih-Wea Wang, Chih-Tsun Huang, Cheng-Wen Wu","doi":"10.1109/vts.2002.1011153","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":237007,"journal":{"name":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","volume":"191 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"39","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/vts.2002.1011153","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 39