Review of the reliability of advanced component packaging technologies

P. Nemeth, Z. Illyefalvi-Vitéz, G. Harsányi
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引用次数: 6

Abstract

Reliability is one of the most important questions in any applications both on package (component), and on board (system) level. In particular, the reliability requirements of automotive under-hood applications are very severe and diverse. Lifetime of an under-hood electronic unit must be 10...20 years, the operation temperature range is -40...150/spl deg/C (depending on the application zone) and the acceleration is 4 g...100 g. The reliability data presented by different component manufacturers were analyzed, compared and evaluated. From the point of view of the analyzed component types, ball grid array packages (BGAs) are in the focus, since they are being considered as replacements for peripheral-leaded plastic quad flat packs (PQFPs) for most future electronics applications. In general, BGAs include packages made of plastic (PBGA) or ceramic (CBGA) materials, using conventional or tape automated bonding (TAB) construction (TBGA), and of very small dimensions called chip scale packages (CSPs). A multichip module packaged in appropriate format is also considered BGA.
先进元件封装技术的可靠性综述
可靠性是包(组件)和板(系统)级应用中最重要的问题之一。特别是,汽车引擎盖下应用的可靠性要求非常严格和多样化。引擎盖下电子装置的使用寿命必须为10…20年,工作温度范围-40…150/spl度/C(取决于应用区域),加速度为4 g…100克。对不同零部件厂商提供的可靠性数据进行了分析、比较和评价。从所分析组件类型的角度来看,球栅阵列封装(bga)是重点,因为它们被认为是大多数未来电子应用中外设引线塑料四平面封装(pqfp)的替代品。一般来说,bga包括由塑料(PBGA)或陶瓷(CBGA)材料制成的封装,使用传统或胶带自动粘合(TAB)结构(TBGA),尺寸非常小,称为芯片级封装(csp)。以适当格式封装的多芯片模块也被认为是BGA。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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