Measurement and simulation of near field emissions from microstrip lines

Abstract

This paper presents results from measurements and simulations of near field scans above a microstrip line on a FR4 dielectric substrate. It is found that, through careful probe calibration, good agreement between measurement and simulation can be obtained up to 1 GHz. Above 1 GHz differences appear some due to physical features that are poorly quantified, particularly the dielectric loss associated with the FR4 substrate.