Integrated photoreceivers with MSM and PIN photodetectors for high-frequency applications

M. Tlaczala
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Abstract

The results of investigation of PIN and MSM photo detectors fabricated in our Semiconductor Device Laboratory are presented. Discrete chips of PIN and MSM photo detectors and similar photo detectors integrated with a MESFET amplifier within a single MMIC chip were tested and compared. The structures were designed for range of wavelengths from 870nm to 1000nm. To accomplish this, the InxGa1-xAs absorption layer with appropriate cantent of indium has been used as an active layer. All structures have been fabricated using Metal Organic Vapor Phase Epitaxy (MOVPE) growth on GaAs substrates with the use of different buffer and matching layer configuration. I-V and spectral characteristics of the PIN and MSM photo detectors and also MMIC structures with the MSM photo detector were evaluated. Time response to the optical pulse excitation has been measured. All designs were compared from the point of view of their application in the optoelectronic integrated circuits.
集成光电接收器与MSM和PIN光电探测器的高频应用
本文介绍了在半导体器件实验室自制的PIN和MSM光电探测器的研究结果。测试和比较了PIN和MSM光电探测器的分立芯片以及在单个MMIC芯片内集成MESFET放大器的类似光电探测器。该结构的设计波长范围为870nm至1000nm。为了实现这一目标,使用了含有适当铟含量的InxGa1-xAs吸收层作为活性层。所有的结构都是利用金属有机气相外延(MOVPE)生长在GaAs衬底上,使用不同的缓冲层和匹配层结构。评价了PIN和MSM光电探测器的I-V和光谱特性,以及带有MSM光电探测器的MMIC结构。测量了光脉冲激发的时间响应。从光电集成电路的应用角度对所有设计进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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